The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Sep. 11, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Tsuyoshi Nagato, Isehara, JP;

Hiroaki Okamoto, Atsugi, JP;

Tetsuo Koezuka, Hachioji, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06N 3/12 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/4609 (2013.01); G06K 9/6229 (2013.01); G06N 3/126 (2013.01);
Abstract

An information processing apparatus is configured to execute generation processing for generating candidates of second image processing program based on an image processing program, the second image processing program being a next generation image processing program in genetic programming, (b): execute first evaluation processing for evaluating fitness of the candidates of the second image processing program by using low-resolution learning data including an input image and a target processing result, the low-resolution learning data being obtained by reducing the resolution of at least the input image, (c): execute second evaluation processing for narrowing down the candidates of the second image processing program based on an evaluation result in the first evaluation processing, and evaluating the fitness of the narrowed-down candidates by using the learning data, and (d): execute determination processing for determining the second image processing program based on an evaluation result in the second evaluation processing.


Find Patent Forward Citations

Loading…