The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Jul. 31, 2019
Splunk Inc., San Francisco, CA (US);
Devin Bhushan, Campbell, CA (US);
Jesse Chor, Los Gatos, CA (US);
Sammy Lee, San Jose, CA (US);
Glen Wong, Santa Clara, CA (US);
SPLUNK INC., San Francisco, CA (US);
Abstract
Techniques are disclosed for using tag placement to determine 3D object orientation. An extended reality (XR) system detects, in a two-dimensional image, a data marker associated with an object viewable in an XR environment. The XR system applies a first function to the data marker to generate a rectilinear data marker by transforming a quadrilateral that circumscribes the data marker into a rectangle. The XR system determines a three-dimensional orientation of the object based on transformation of the data marker to the rectilinear data marker. The XR system determines an XR object associated with the data marker. The XR system applies a second function to the XR object, where the second function uses the three-dimensional orientation of the data marker to modify an orientation of the XR object to generate a transformed XR object. The XR system causes the transformed XR object to be displayed within the two-dimensional image.