The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Sep. 17, 2019
Doosan Heavy Industries & Construction Co., Ltd., Changwon-si, KR;
Jee Hun Park, Gwangmyeong-si, KR;
Jae Hyeon Park, Hwaseong-si, KR;
Sang Jin Lee, Yongin-si, KR;
Hyun Sik Kim, Gimpo-si, KR;
Other;
Abstract
An apparatus and method for diagnosing analysis is provided. The apparatus includes an analytic layer to divide a peripheral space of a target component into a plurality of cells and to derive analytic data by performing a numerical analysis iteration according to computational fluid dynamics for the plurality of cells; a model layer to derive an analytic model that simulates the numerical analysis iteration; a predictive layer to derive predictive data by predicting a result of the numerical analysis iteration by using the analytic model; and a diagnostic layer to diagnose an abnormality condition of numerical analysis by comparing the analytic data and predictive data during the numerical analysis iteration performed by the analytic layer. The diagnostic layer includes an early alarm to generate early alarm information by sorting a cell satisfying an early alarm condition; and an abnormality diagnostic device to determine whether the numerical analysis iteration is abnormal.