The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Jul. 17, 2018
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Kevin Lo, Redmond, WA (US);

Daiqian Hu, Shanghai, CN;

Hongquan Yin, Suzhou, CN;

Lei He, Suzhou, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/57 (2013.01); G06F 21/55 (2013.01); G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 21/554 (2013.01); G06F 21/566 (2013.01); G06F 21/568 (2013.01);
Abstract

A set of high level test logic is configured to include a set of insertion points. The high-level test logic can be controlled to insert test conditions into a data center configuration. It can also be configured to execute remediation actions that are to be taken, and validation actions to be performed in order to determine whether the remediation action works against the test conditions. Different instances of the high-level test logic can be configured for different environments and different test conditions.


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