The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Sep. 30, 2019
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Nakul Ogale, Pune, IN;

Shirish Vijayvargiya, Pune, IN;

Sachin Shinde, Pune, IN;

Assignee:

VMware, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 23/00 (2006.01); G06F 12/16 (2006.01); G06F 12/14 (2006.01); G06F 11/00 (2006.01); G06F 21/52 (2013.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/52 (2013.01); G06F 2221/033 (2013.01); G06N 20/00 (2019.01);
Abstract

A process monitoring methodology is disclosed. In a computer-implemented method, a selection of a process to be monitored is received. The process is to be at least partially performed using a component of a computing environment. An expected operating parameter of the process is determined. The process is also monitored to determine an actual operating parameter of the process. The actual operating parameter of the process is compared with the expected operating parameter of the process to generate a comparison result. An operation is then automatically performed based upon the comparison result.


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