The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Sep. 04, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kazuyuki Oota, Tokyo, JP;

Toshiyuki Ukai, Tokyo, JP;

Kazuaki Tokunaga, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/33 (2019.01); G06K 9/62 (2006.01); G06F 16/909 (2019.01); G06F 16/951 (2019.01); G06F 16/335 (2019.01);
U.S. Cl.
CPC ...
G06F 16/334 (2019.01); G06F 16/335 (2019.01); G06F 16/909 (2019.01); G06F 16/951 (2019.01); G06K 9/623 (2013.01); G06K 9/6221 (2013.01);
Abstract

An analysis system is configured to acquire data of a first numeric feature combination by referring to the parent population data. The data of the first numeric feature combination includes a score of a target indicator for each of category combinations. Each category combination of the category combinations is composed of categories of the numeric features of the first numeric feature combination. The analysis system is configured to determine a score at coordinates corresponding to each of the category combinations in a space having each of the numeric features of the first numeric feature combination as an axis, calculate a gradient feature vector representing a gradient for the score in the space, and determine, based on the gradient feature vector, whether to include the first numeric feature combination in numeric feature combinations to be extracted from the parent population data.


Find Patent Forward Citations

Oota, Kazuyuki. (2021). Analysis system (U.S. Patent No. 11182413). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11182413

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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