The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Apr. 23, 2019
Applicant:

Spirent Communications, Inc., San Jose, CA (US);

Inventors:

David Joyner, Raleigh, NC (US);

Rahul Patel, La Palma, CA (US);

Assignee:

SPIRENT COMMUNICATIONS, INC., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/00 (2019.01); G06F 16/2458 (2019.01); G06F 16/14 (2019.01); G06F 16/21 (2019.01); G06F 16/28 (2019.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2477 (2019.01); G06F 16/156 (2019.01); G06F 16/212 (2019.01); G06F 16/24561 (2019.01); G06F 16/283 (2019.01);
Abstract

The technology disclosed relates to a method for storing and time-correlating real-time and queryable test results of a test of a device under test (DUT). The method includes initiating the test applied to the DUT to collect real-time data from a multitude of data streams for multiple aspects of the DUT, the collected data including counters and fact-type values, the collected data having imperfectly synchronized time bases and the collected data being collected from different sources asynchronously at different times, specifying a recording time interval for recording the data collected among multiple databases, recording data according to the specified recording time interval, such that each piece of the recorded data is associated with a particular time interval, and at a conclusion of the test, correlating the recorded data with the test configuration data about a test state in the respective time intervals.


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