The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Oct. 16, 2017
Omron Corporation, Kyoto, JP;
Takeshi Naito, Ibaraki, JP;
Tetsuji Yamato, Yokohama, JP;
Toshihiko Oda, Kusatsu, JP;
Shuichi Misumi, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
Provided are a dataflow control command generation apparatus, a dataflow control command generation method, and a dataflow control command generation program by which open data is distributed as appropriate and open data can be smoothly used by an application. A dataflow control command generation apparatus includes a first data-side metadata acquisition unit configured to acquire first data-side metadata that is information regarding first data, an application-side metadata acquisition unit configured to acquire application-side metadata that is information regarding an application that provides a service using first data, a matching unit configured to extract first data that meets a requirement of an application through matching between the first data-side metadata and the application-side metadata, and a transmission unit configured to transmit, to a user terminal apparatus that executes the application, a dataflow control command including information for acquiring the first data from a database storing the extracted first data.