The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Mar. 14, 2016
Applicant:

Vmware, Inc., Palo Alto, CA (US);

Inventors:

Edward J Goggin, Concord, MA (US);

Sandeep Rangaswamy, Mountain View, CA (US);

Kiran Joshi, San Jose, CA (US);

Srinath Premachandran, Fremont, CA (US);

Gopala Suryanarayana, Sunnyvale, CA (US);

Radu Berinde, Cambridge, MA (US);

Wenguang Wang, Santa Clara, CA (US);

Jorge Guerra Delgado, Fremont, CA (US);

Jin Zhang, Fremont, CA (US);

Radhika Vullikanti, Foster City, CA (US);

Assignee:

VMWARE, INC., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/174 (2019.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 16/1748 (2019.01); H04L 67/1004 (2013.01); H04L 67/1097 (2013.01);
Abstract

In accordance with the present disclosure, files may be deduplicated in a distributed storage system having a plurality of storage volumes. A uniqueness metric for each file may indicate a degree of deduplication of the respective data files in the given storage volume. The uniqueness metric may be used to identify files for rebalancing in the distributed storage system. The uniqueness metric may be efficiently calculated with enough accuracy using a sampling methodology.


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