The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Nov. 01, 2019
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Rômulo Teixeira de Abreu Pinho, Niterói, BR;
Hugo de Oliveira Barbalho, Rio de Janeiro, BR;
Vinícius Michel Gottin, Rio de Janeiro, BR;
Roberto Nery Stelling Neto, Rio de Janeiro, BR;
Alex Laier Bordignon, Niterói, BR;
Daniel Sadoc Menasché, Rio de Janeiro, BR;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques are provided for characterizing and quantifying a sequentiality of workloads using sequentiality profiles and signatures. One exemplary method comprises obtaining telemetry data for an input/output workload; evaluating a distribution over time of sequence lengths for input/output requests in the telemetry data by the input/output workload; and generating a sequentiality profile for the input/output workload to characterize the input/output workload based at least in part on the distribution over time of the sequence lengths. Multiple sequentiality profiles for one or more input/output workloads may be clustered into a plurality of clusters. A sequentiality signature may be generated to represent one or more sequentiality profiles within a given cluster. A performance of data movement policies may be evaluated with respect to the sequentiality signature of the given cluster.