The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Feb. 28, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Deborah A. Furman, Staatsburg, NY (US);
Michael E. Gildein, Wappingers Falls, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for detecting and localizing a fault in a system under test (SUT) includes generating an initial set of test vectors that provides complete n-wise coverage of the reduced test space. The method further includes generating and executing an initial set of test cases to obtain a first set of execution results. The method further includes determining, based at least in part on the first set of execution results, that one or more test cases failed execution. The method further includes generating a set of new test cases from a selected failing test case. The method further includes executing the set of new test cases to obtain a second set of execution results. The method further includes detecting and localizing the fault based at least in part on the second set of execution results.