The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Apr. 28, 2020
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventors:

Amit Shriram Kalamkar, Fremont, CA (US);

Edward K. Lee, Mountain View, CA (US);

Vigith Maurice, Mountain View, CA (US);

Assignee:

Intuit Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06F 11/0757 (2013.01);
Abstract

A method including receiving events from different data sources for a service automatically executing in an enterprise system. A first event is enriched by providing the first event with first metadata that associates the first event with a first application used by the service. The first event is assigned to a time slice associated with the first application. A second event is enriched in a similar manner. A correlation graph of nodes and edges is built using the enriched events, with nodes representing the events and edges indicating relationships between the edges. A third event indicating a fault in the first application associated with the first node is received. The source of the error for the third event is identified using the second updated correlation graph and the time slice. The source of error is then mitigated.


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