The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Dec. 03, 2019
D-wave Systems Inc., Burnaby, CA;
Andrew J. Berkley, Vancouver, CA;
Richard G. Harris, Vancouver, CA;
D-WAVE SYSTEMS INC., Burnaby, CA;
Abstract
Methods for reducing errors in calibrated devices comprise detecting outliers, self-checking consistency of measurements, tuning device controls to target values, and absolutely calibrating devices via a first standard and cross-checking the results via a second standard. The first standard may be a calibrated current and the second calibration standard may be a calibrated frequency. A calibrated frequency may be a microwave signal applied to the body of a qubit. Qubit annealing controls can quickly lower and raise the tunnel barrier to measures the oscillation frequency of the qubit between two potential wells.