The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Apr. 28, 2016
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Junichi Funada, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 1/02 (2020.01); G05D 1/00 (2006.01); G01N 21/954 (2006.01); G01N 21/84 (2006.01); G01M 3/24 (2006.01); G01N 29/265 (2006.01); G01N 29/22 (2006.01); G06K 9/00 (2006.01); G01M 3/02 (2006.01);
U.S. Cl.
CPC ...
G05D 1/0223 (2013.01); G01M 3/24 (2013.01); G01N 21/84 (2013.01); G01N 21/954 (2013.01); G01N 29/22 (2013.01); G01N 29/265 (2013.01); G05D 1/0088 (2013.01); G01M 3/02 (2013.01); G05D 2201/0207 (2013.01); G06K 9/00791 (2013.01);
Abstract

An object of the invention is to provide a new defect detection technique using an autonomously movable apparatus. In order to accomplish the object, the invention provides a detection system () including a drive control unit () that controls a driving unit () causing a base unit () to travel in a case where a predetermined detection target is detected on the basis of information collected by a sensor unit () installed in the base unit (), and a second detection unit () that detects a predetermined defect on the basis of the information collected by the sensor unit ().


Find Patent Forward Citations

Loading…