The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

May. 22, 2018
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Takuya Nakayama, Fukuoka, JP;

Tetsushi Oohori, Tokyo, JP;

Kenichiro Ishimoto, Saga, JP;

Atsushi Nakazono, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/4063 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4063 (2013.01); G05B 2219/31455 (2013.01); G05B 2219/34279 (2013.01);
Abstract

A manufacturing device monitoring system includes a plurality of manufacturing devices and a remote monitoring device. The manufacturing device includes a work unit, an equipment notifier, an error detector, and an error notifier. The error notifier determines whether or not an error detected by the error detector may be corrected by an operation from the remote monitoring device, notifies the remote monitoring device of the occurrence of the error in a case where the error can be corrected, and operates the equipment notifier to notify a first notification pattern in a case where the error cannot be corrected.


Find Patent Forward Citations

Nakayama, Takuya. (2021). Manufacturing device monitoring system and manufacturing device (U.S. Patent No. 11181885). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11181885

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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