The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

May. 18, 2020
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Akihito Hashimoto, Saitama, JP;

Akio Akamatsu, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70133 (2013.01); G03F 7/70641 (2013.01);
Abstract

The present invention provides an exposure apparatus that performs an exposure process to transfer a pattern of a mask to a substrate, including a projection optical system configured to project the pattern of the mask onto the substrate, a measurement pattern arranged on an object plane of the projection optical system and including a plurality of pattern elements having different positions in an optical axis direction of the projection optical system, a first detection unit configured to detect light from the measurement pattern via the projection optical system, and a control unit configured to control a relative position between the mask and the substrate in the optical axis direction when the exposure process is performed.


Find Patent Forward Citations

Hashimoto, Akihito. (2021). Exposure apparatus and method of manufacturing article (U.S. Patent No. 11181825). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11181825

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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