The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Mar. 10, 2017
Applicant:

University of Notre Dame Du Lac, South Bend, IN (US);

Inventors:

Scott Howard, Notre Dame, IN (US);

Genevieve Vigil, South Bend, IN (US);

Yide Zhang, South Bend, IN (US);

Assignee:

UNIVERSITY OF NOTRE DAME DU LAC, South Bend, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/365 (2013.01);
Abstract

One aspect of the present disclosure relates to systems and methods that can be used for super-sensitivity multiphoton frequency-domain fluorescence lifetime imaging microscopy (MPM-FD-FLIM). One or more laser light sources can deliver excitation light with an intensity modulated by a periodic function to a sample, which includes a fluorophore concentration. A receiver can receive a fluorescence signal emitted from the fluorophore concentration over a time period. A computing device can transform the fluorescence signal to the frequency domain and measure a fluorescence lifetime associated with the sample in the frequency domain based on a DC component and at least one higher harmonic component generated by non-linear optical mixing of the modulated excitation light. Using the DC component and the at least one higher harmonic component can increase the sensitivity of an image created by the MPM-FD-FLIM system.


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