The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Nov. 15, 2017
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

David H. Redinger, Afton, MN (US);

Christopher R. Yungers, Saint Paul, MN (US);

Jennifer F. Schumacher, Woodbury, MN (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/20 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01);
Abstract

Systems and methods for detecting a crack or defect in a material are described. An example method may include determining, by a computing device, for each respective adjacent pair of electrodes of a plurality of electrodes electrically coupled to the material, a respective electrode pair voltage. The method also may include determining, by the computing device, for each respective adjacent pair of electrodes, a respective temperature-corrected electrode pair value based on the respective electrode pair voltage and at least one of a respective control voltage associated with the respective adjacent pair of electrodes or a temperature correction factor. The method may further include determining, by the computing device, whether the material includes a crack or defect based on the plurality of respective temperature-corrected electrode pair values.


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