The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Mar. 29, 2018
Applicant:

Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;

Inventors:

Julien Vulliet, Chambray-les-Tours, FR;

Cécile Autret, Saint-Epain, FR;

Christophe Honstettre, Esvres-sur-Indre, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2018.01); G01N 23/20 (2018.01); H01M 8/12 (2016.01); G01N 23/20016 (2018.01); G01N 23/20033 (2018.01); C25B 1/04 (2021.01); H01M 8/04537 (2016.01);
U.S. Cl.
CPC ...
G01N 23/207 (2013.01); G01N 23/20016 (2013.01); G01N 23/20033 (2013.01); H01M 8/12 (2013.01); C25B 1/04 (2013.01); G01N 2223/05 (2013.01); G01N 2223/20 (2013.01); G01N 2223/3106 (2013.01); G01N 2223/317 (2013.01); G01N 2223/60 (2013.01); H01M 8/04574 (2013.01);
Abstract

A device keeps an electrochemical cell under current and at operating temperature during an X-ray beam diffraction analysis of a first electrode, the cell comprising a solid electrolyte interposed between the electrodes. The device comprises: first and second interconnectors having contact faces contacting the electrodes, which allow a gas flow and exchange between the interconnectors and the electrodes. The contact face of the first interconnector allows an X-ray beam to pass to the first electrode. A thermal and atmospheric containment chamber has an inner cavity housing a stack formed from the cell between the interconnectors and a cover closing the cavity, provided with a window allowing X-rays to pass through, the first interconnector being intended to be arranged facing the cover. The contact face of each interconnector is a slotted element; slotted portions of the slotted element are uniformly arranged and form 30% to 80% of the element's surface area.


Find Patent Forward Citations

Vulliet, Julien. (2021). Device, system and method for x-ray diffraction analysis of an electrode of an electrochemical cell, at operating temperature and under current (U.S. Patent No. 11181492). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11181492

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…