The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Nov. 30, 2018
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Eric J. Campbell, Rochester, MN (US);
Joseph Kuczynski, North Port, FL (US);
Sarah K. Czaplewski-Campbell, Rochester, MN (US);
Timothy J. Tofil, Rochester, MN (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01); G01N 21/64 (2006.01); G01N 27/20 (2006.01);
U.S. Cl.
CPC ...
G01N 15/088 (2013.01); G01N 21/643 (2013.01); G01N 27/205 (2013.01);
Abstract
A multilayer component is coated with a fluorogenic probe designed to give off florescence when in contact with one or more metals in the multilayer component. The fluorogenic probe is exposed to radiation. The intensity and wavelength of the florescence is measured to determine a porosity of the one or more layers of the multilayer component.