The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Aug. 27, 2019
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Kyoto University, Kyoto, JP;
Tomoki Shiotani, Kyoto, JP;
Katsufumi Hashimoto, Kyoto, JP;
Hidefumi Takamine, Shinagawa, JP;
Kazuo Watabe, Yokohama, JP;
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Kyoto University, Kyoto, JP;
Abstract
According to one embodiment, a structure evaluation system according to an embodiment includes a plurality of sensors, a position locator, and an evaluator. The plurality of sensors detect elastic waves. The position locator locates positions of elastic wave sources by using the elastic waves among the plurality of elastic waves respectively detected by the plurality of sensors having an amplitude exceeding a threshold value determined according to positions of the sources of the plurality of elastic waves and the positions of the plurality of disposed sensors. The evaluator evaluates a deteriorated state of the structure on the basis of results of the position locating of the elastic wave sources which is performed by the position locator.