The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Mar. 15, 2019
Leica Geosystems Ag, Heerbrugg, CH;
Norbert Kotzur, Altstätten, CH;
Hannes Maar, Dornbirn, AT;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A total station configured for receiving from a camera a first image captured in a first face and a second image captured in a second face, wherein in the second face the camera is rotated around the optical axis by between 170° and 190° compared to the first face, receiving at least one of an azimuthal angle pair and an elevative angle pair, said azimuthal angle pair comprising a first azimuthal angle and a second azimuthal angle, and said elevative angle pair comprising a first elevative angle a second elevative angle, matching the first image and the second image with a relative rotation and a relative translation, determining the relative rotation of the matched first image and second image, determining the relative translation of the matched first image and second image, based on the respective angle pair, the relative rotation, the relative translation, and determining an instrument error.