The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Apr. 19, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kenji Yaegashi, Utsunomiya, JP;

Toshiki Iwai, Utsunomiya, JP;

Takamitsu Komaki, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/27 (2006.01); G02B 27/60 (2006.01); G03F 9/00 (2006.01); G02B 27/32 (2006.01);
U.S. Cl.
CPC ...
G01B 11/272 (2013.01); G02B 27/32 (2013.01); G02B 27/60 (2013.01); G03F 9/7042 (2013.01); G03F 9/7088 (2013.01);
Abstract

A measurement device for measuring a relative position between alignment marks includes an illumination unit capable of illuminating the alignment marks at a plurality of wavelengths, a detection unit that detects light from the alignment marks, a processing unit that obtain the relative position between the alignment marks, and an adjustment unit that adjusts a relative amount between light amounts of the plurality of wavelengths so that a relative value between detection light amounts of light from the alignment marks falls within a predetermined range.


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