The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 23, 2021
Filed:
Jan. 10, 2017
Ntn Corporation, Osaka, JP;
Hiroaki Ohba, Iwata, JP;
NTN CORPORATION, Osaka, JP;
Abstract
A method of measuring a volume of a micro projection includes: measuring a three-dimensional shape of the micro projection using white-light interferometry; comparing a height at which a first peak of an envelope of an interference light intensity is detected with a height of a reference plane, and extracting a projection top portion of the micro projection; detecting a height of the extracted projection top portion; detecting a diameter based on a lateral dimension and a longitudinal dimension of a circumscribed quadrangle in an area that constitutes the projection top portion and a region having a height different from the height of the reference plane, the region including or being in contact with the projection top portion; and calculating the volume of the micro projection based on the height of the projection top portion and the diameter.