The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Apr. 24, 2019
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Toshikazu Hayashi, Tokyo, JP;

Hiroyoshi Kubo, Tokyo, JP;

Atsushi Yuge, Tokyo, JP;

Kentaro Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F15B 19/00 (2006.01); F15B 20/00 (2006.01); F04B 49/10 (2006.01);
U.S. Cl.
CPC ...
F15B 19/005 (2013.01); F04B 49/10 (2013.01); F15B 19/007 (2013.01); F15B 20/00 (2013.01); F04B 2201/12 (2013.01);
Abstract

An abnormality diagnosis method is targeted at a hydraulic device which includes a hydraulic pump and a driven device driven by the hydraulic pump. The method includes calculating a frequency distribution with regard to a deviation between a normal value of an output parameter corresponding to an operation condition and an actual measurement value of the output parameter using a prediction model, and determining the presence of an abnormality if an average of the deviation exceeds a threshold. If the presence of the abnormality is determined, a factor of the abnormality is estimated based on the range of the deviation where a waveform peak of the frequency distribution exists.


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