The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 23, 2021

Filed:

Jun. 20, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Gereon Vogtmeier, Aachen, DE;

Ravindra Bhat, Eindhoven, NL;

Biswaroop Chakrabarti, Kolkata, IN;

Prasad Raghotham Venkat, Bangalore, IN;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/10 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/10 (2013.01); A61B 6/4405 (2013.01); A61B 6/548 (2013.01); A61B 6/545 (2013.01);
Abstract

An apparatus (M) and related method for supporting X-ray imaging. The apparatus comprises an input interface (IN) for receiving a request to perform an X-ray exposure with an X-ray source (XR) of an X-ray imager (XI) to image an object (PAT). A compliance checker (CC) of the apparatus (M) is configured to check said request against an imaging safety protocol for said object to produce a safety compliance result. A safety enforcer (SE) of the apparatus is configured to issue, based on the safety compliance result, i) an alert signal and/or ii) a control signal to initiate a safety action that at least affect an impact of the requested X-ray exposure on the object.


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