The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Nov. 18, 2013
Texas Instruments Incorporated, Dallas, TX (US);
Hyung Joon Kim, Johns Creek, GA (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
A method for determining coding unit (CU) partitioning of a largest coding unit (LCU) of a picture is provided that includes computing a first statistical measure and a second statistical measure for the LCU, selecting the LCU as the CU partitioning when the first statistical measure does not exceed a first threshold and the second statistical measure does not exceed a second threshold, and selecting CUs in one or more lower layers of a CU hierarchy of the LCU to form the CU partitioning when the first statistical measure exceeds the first threshold and/or the second statistical measure exceeds the second threshold.