The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Mar. 29, 2018
Nec Corporation, Tokyo, JP;
Gaku Nakano, Tokyo, JP;
Kazuhito Murata, Tokyo, JP;
Asuka Ishii, Tokyo, JP;
Masahiko Ohta, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A vibration measurement system comprises an image capturing apparatus, a distance measuring apparatus, a sensor that outputs a signal according to an inclination of the image capturing apparatus relative to the vertical direction, and a vibration measurement apparatus. The vibration measurement apparatus includes calculating an angle formed by the normal of an image capturing surface of the image capturing apparatus and the normal of the measurement target surface that the image capturing apparatus shoots, based on the signal output by the sensor, converting the image obtained that the image capturing apparatus shoots into an image that would be obtained were the normal of the measurement target surface coincident with the normal of the image capturing surface of the image capturing apparatus, using the calculated angle, and measuring vibration of the structure, using the converted image and the measured distance from the image capturing apparatus to the measurement target surface.