The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

May. 22, 2020
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Adrian Ispas, Munich, DE;

Julian Leyh, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01);
Abstract

A method of analyzing at least one periodic horizontal impairment component of an input signal is described. The input signal is received that includes at least a periodic horizontal impairment component. The at least one periodic horizontal impairment component is analyzed based on a first model, thereby obtaining a first estimated parameter set for each analyzed periodic horizontal impairment component. The at least one periodic horizontal impairment component is analyzed based on a second model, thereby obtaining a second estimated parameter set for each analyzed periodic horizontal impairment component. The first model is different to the second model. Further, the present disclosure provides a measurement instrument.


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