The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Feb. 23, 2018
Applicant:
Analog Devices Global Unlimited Company, Hamilton, BM;
Inventors:
Ahmed I. Khalil, Cairo, EG;
Mohamed Ahmed Youssef Abdalla, Cairo, EG;
Islam A. Eshrah, Cairo, EG;
Mohamed Mobarak, Cairo, EG;
Assignee:
Analog Devices Global Unlimited Company, Hamilton, BM;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 3/26 (2006.01); H04B 17/12 (2015.01); H04B 17/19 (2015.01); H01Q 1/24 (2006.01); H01Q 3/38 (2006.01); H01Q 21/22 (2006.01); H01Q 21/00 (2006.01); H04B 17/21 (2015.01); H04B 17/14 (2015.01);
U.S. Cl.
CPC ...
H01Q 3/267 (2013.01); H01Q 1/247 (2013.01); H01Q 3/38 (2013.01); H01Q 21/0025 (2013.01); H01Q 21/22 (2013.01); H04B 17/12 (2015.01); H04B 17/19 (2015.01); H04B 17/21 (2015.01); H04B 17/14 (2015.01);
Abstract
Aspects of this disclosure relate to an antenna array system and method of calibration using one or more probes disposed equidistant between antenna elements. In certain embodiments, calibration is performed between a probe and antenna elements, between a plurality of antenna elements, and/or between antenna elements on different antenna arrays.