The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Oct. 16, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Karan Jain, Cupertino, CA (US);

William P. Yarak, III, San Francisco, CA (US);

Chia Chi Wu, New Taipei, TW;

Nicole Wells, San Francisco, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01H 13/785 (2006.01); G06F 3/02 (2006.01); H01H 13/80 (2006.01);
U.S. Cl.
CPC ...
H01H 13/80 (2013.01); G06F 3/0202 (2013.01); H01H 13/785 (2013.01);
Abstract

This disclosure relates to touch-sensitive mechanical keyboards and methods for detecting touch events and key depression events on the touch-sensitive mechanical keyboard. The keypad can include a plurality of domes, a plurality of key make electrodes, first touch electrodes, and second touch electrodes. The first touch electrodes may be located underneath the plurality of key make electrodes, and the second touch electrodes may not. Both touch electrodes can detect touch events based on self-capacitance sensing. A key depression event can cause the key make electrode to make electrical contact with a corresponding first touch electrode, creating a short circuit that may cause the measured signal to saturate. The keyboard can include a plurality of sensing circuits coupled to the key make electrodes, the first touch electrodes, and the second touch electrodes. The plurality of sensing circuits can be used to detect both touch events and key depression events.


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