The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Jun. 08, 2020
Applicant:
Kioxia Corporation, Tokyo, JP;
Inventors:
Kensuke Yamamoto, Yokohama Kanagawa, JP;
Fumiya Watanabe, Yokohama Kanagawa, JP;
Shouichi Ozaki, Tokyo, JP;
Assignee:
KIOXIA CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/30 (2006.01); G11C 16/08 (2006.01); G11C 16/32 (2006.01); G11C 7/10 (2006.01); G06F 3/06 (2006.01); H03K 5/156 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 16/30 (2013.01); G06F 3/0611 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G11C 7/109 (2013.01); G11C 7/1063 (2013.01); G11C 7/1066 (2013.01); G11C 16/08 (2013.01); G11C 16/32 (2013.01); G11C 29/50012 (2013.01); H03K 5/1565 (2013.01); G11C 2207/2254 (2013.01);
Abstract
A semiconductor storage device includes a first chip and a second chip each including a memory cell and configured to receive a same toggle signal. Upon receiving a first command, the first chip executes a first calibration operation to calibrate a duty ratio of an output signal generated in response to the toggle signal while data is read out from the second chip in response to the toggle signal.