The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Jul. 18, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Nam Huyn, Milpitas, CA (US);

Ravigopal Vennelakanti, San Jose, CA (US);

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 7/18 (2006.01); G06T 7/73 (2017.01); G06K 9/62 (2006.01); G06T 7/55 (2017.01);
U.S. Cl.
CPC ...
G06T 7/74 (2017.01); G06K 9/6215 (2013.01); G06T 7/55 (2017.01); G06T 7/75 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

Example implementations described herein are directed to a solution to the problem of accurate real-time inventory counting and industrial inspection. The solution, involves a device such as a mobile device that assists a human operator on the field to quickly achieve high quality inspection results. The example implementations detect objects of interest in individual image snapshots and use location and orientation sensors to integrate the snapshots to reconstruct a more accurate virtual representation of the inspection area. This representation can then be reorganized in various ways to derive inventory counts and other information that are not planned originally.


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