The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Dec. 03, 2019
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kiyokatsu Ikemoto, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/586 (2017.01); G06T 7/73 (2017.01); H04N 5/225 (2006.01); G06T 7/521 (2017.01); G01B 11/25 (2006.01); G02F 1/1335 (2006.01); G02F 1/13363 (2006.01); G02F 1/1337 (2006.01);
U.S. Cl.
CPC ...
G06T 7/586 (2017.01); G01B 11/2513 (2013.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01); H04N 5/2256 (2013.01); G02F 1/1337 (2013.01); G02F 1/13363 (2013.01); G02F 1/133528 (2013.01); G02F 1/133742 (2021.01); G02F 2413/01 (2013.01);
Abstract

A shape information acquisition apparatus, comprises a memory and at least one processor and/or at least one circuit to perform operations of the following units. The acquiring unit is configured to acquire photometric images for which a subject is illuminated from different directions by an illuminance portion and a pattern projection image for which a predetermined light pattern is projected onto the subject by a projection portion. The detection unit configured to detect a position of the illuminance portion based on the pattern projection image. The shape calculation unit configured to calculate shape information for the subject based on the photometric images and the position of the illuminance portion.


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