The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Sep. 27, 2019
Snow Corporation, Seongnam-si, KR;
Sangho Choi, Seongnam-si, KR;
Byung-Sun Park, Seongnam-si, KR;
Junghwan Jin, Seongnam-si, KR;
Wonhyo Yi, Seongnam-si, KR;
Hyeongbae Shin, Seongnam-si, KR;
Seongyeop Jeong, Seongnam-si, KR;
Sungwook Kim, Seongnam-si, KR;
Noah Hahm, Seongnam-si, KR;
Jimin Kim, Seongnam-si, KR;
SNOW CORPORATION, Gyeonggi-do, KR;
Abstract
An image processing method including acquiring depth information on at least one of a first portion of a specific object included in a target image or a second portion in a region of the target image that excludes the specific object based on reference pattern information, the reference pattern information including first information on a shape of an object included in an image and second information on a relative position between at least two objects included in the image, and applying a dynamic effect to at least one of the first portion or the second portion based on the acquired depth information may be provided.