The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Dec. 11, 2019
Naver Corporation, Gyeonggi-do, KR;
Naver Labs Corporation, Gyeonggi-do, KR;
Jérome Revaud, Meylan, FR;
Cesar De Souza, Grenoble, FR;
Martin Humenberger, Gières, FR;
Philippe Weinzaepfel, Montbonnot-Saint-Martin, FR;
NAVER CORPORATION, Gyeonggi-Do, KR;
NAVER LABS CORPORATION, Gyeonggi-Do, KR;
Abstract
A system for detecting and describing keypoints in images is described. A camera is configured to capture an image including a plurality of pixels. A fully convolutional network is configured to jointly and concurrently: generate descriptors for each of the pixels, respectively; generate reliability scores for each of the pixels, respectively; and generate repeatability scores for each of the pixels, respectively. A scoring module is configured to generate scores for the pixels, respectively, based on the reliability scores and the repeatability scores of the pixels, respectively. A keypoint list module is configured to: select X of the pixels having the X highest scores, where X is an integer greater than 1; and generate a keypoint list including: locations of the selected X pixels; and the descriptors of the selected X pixels.