The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Sep. 26, 2019
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Kumaraswamy Gowda, Bangalore, IN;

Nithya Rajagopalan, Bangalore, IN;

Nishant Kumar, Bangalore, IN;

Panish Ramakrishna, Bangalore, IN;

Rajendra Vuppala, Dublin, CA (US);

Erica Vandenhoek, Palo Alto, CA (US);

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/295 (2020.01); G06F 40/177 (2020.01); G06F 40/49 (2020.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 40/295 (2020.01); G06F 40/177 (2020.01); G06F 40/49 (2020.01); G06K 9/6278 (2013.01);
Abstract

The present disclosure involves systems, software, and computer implemented methods for creating line item information from tabular data. One example method includes receiving event data values at a system. Column headers of columns in the event data values are identified. At least one column header is not included in standard line item terms used by the system. Column values of the columns in the event data values are identified. The identified column headers and the identified column values are processed using one or more models to map each column to a standard line item term used by the system. The processing includes using context determination and content recognition to identify standard line item terms. An event is created in the system, including the creation of line items from the identified column value. Each line item includes standard line item terms mapped to the columns.


Find Patent Forward Citations

Loading…