The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Mar. 13, 2020
International Business Machines Corporation, Armonk, NY (US);
Robert Nonez, Ontario, CA;
A A Kasun Attanapola, Ontario, CA;
Ilse M. Breedvelt-Schouten, Ontario, CA;
Charlie Le, Ottawa, CA;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method including: receiving a base map that is divided into geographical base regions, each of the geographical base regions having a measure of a first parameter; receiving a plurality of secondary maps that are each divided into a plurality of geographical regions, each of the geographical regions having a measure of a secondary parameter; determining a total overlap percentage for each of the secondary maps relative to the base map, the total overlap percentage for one of the secondary maps being an average of overlap percentages of each of the geographical regions of the one of the secondary maps with the geographical base regions of the base map; receiving a selection of one of the secondary maps; and applying the secondary parameter of the selected secondary map to each of the geographical base regions of the base map.