The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Dec. 07, 2018
International Business Machines Corporation, Armonk, NY (US);
Yifan Xu, Redmond, WA (US);
James Natale, Hudson, OH (US);
Matthew Hagenbuch, Brecksville, OH (US);
Matthew M. Pohlman, Shaker Heights, OH (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer system processes data records in a multi-tenant environment to ensure data quality. A plurality of records from a plurality of data sources are processed to provide a data quality metric for each field of the plurality of records based on record values in the field. A threshold range satisfying a specificity level of a data source is selected for each data quality metric. The data quality metric is compared to the threshold range to determine whether the data quality metric violates the threshold. A data quality report is provided for the plurality of records, wherein the data quality report indicates whether the data quality metric of each field violates the selected threshold range. Embodiments of the present invention further include a method and program product for processing data records in a multi-tenant environment to ensure data quality in substantially the same manner described above.