The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Sep. 22, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sushain Pandit, Austin, TX (US);

Kuntal Dey, New Delhi, IN;

Charles Daniel Wolfson, Austin, TX (US);

Jitendra Singh, Noida, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3089 (2013.01); G06F 11/0772 (2013.01); G06F 11/0781 (2013.01); G06F 11/321 (2013.01); G06F 11/327 (2013.01);
Abstract

According to one embodiment, a method, computer system, and computer program product for detecting and managing anomalies in one or more sensors is provided. The present invention may include simulating, by one or more environmental models, an expected output of the one or more sensors; responsive to identifying that an actual output of the one or more sensors differs from the expected output by a threshold value, detecting one or more anomalous sensors; and performing one or more actions to manage the one or more anomalous sensors based on the presence of the one or more sensors within a plurality of anomaly reaction zones.


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