The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Dec. 26, 2018
Adtran, Inc., Huntsville, AL (US);
Arlynn Wayne Wilson, Huntsville, AL (US);
ADTRAN, Inc., Huntsville, AL (US);
Abstract
Systems and methods are provided for detecting fault conditions associated with an distribution point in a communication system using retrain event data. The retrain event data is collected for all of the ports associated with a target site of the distribution point. The collected retrain event data can then be organized into several different categories such as upstream related retrain events and downstream related retrain events. A screening criteria can be selected that is associated with a fault condition. The screening criteria can be evaluated using one or more evaluation metrics. Each evaluation metric can be based on normalized parameters generated from the categorized retrain event data. If all of the evaluation metrics associated with a screening criteria are satisfied, then the screening criteria is satisfied and the target site is determined to have a fault condition.