The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Oct. 21, 2020
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Jacek Tyminski, Lassnitzhoehe, AT;

Wolfgang Kuchler, Graz, AT;

Georg Burgler, Gratkorn, AT;

Sandeep Mallya, Bangalore, IN;

Pradeep Kumar Aithagani, Bangalore, IN;

Chinmay Gururaj Kathani, Bangalore, IN;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/04 (2006.01); G06F 1/14 (2006.01); G01S 13/08 (2006.01); H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
G06F 1/14 (2013.01); G01S 13/08 (2013.01); H03L 7/099 (2013.01); H03L 2207/06 (2013.01);
Abstract

A method for optimizing power of a ranging sequence includes counting at least one cycle of a first clock during a Crystal Oscillator (XO)-mode to generate a first cycle count. A second clock is activated at an end of the XO-mode. The first cycle count is converted into a fractional correction value by multiplying the first cycle count by a ratio of a second period of the second clock divided by a first period of the first clock. A first alignment of the first clock to the second clock is determined at a beginning of the XO-mode. A second alignment of the first clock to the second clock is determined at the end of the XO-mode. An adjusted cycle count is determined by summating the fractional correction value with a summation of the first alignment and the second alignment divided by the first period.


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