The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Mar. 02, 2020
Applicant:
Cree, Inc., Durham, NC (US);
Inventors:
Daniel Jenner Lichtenwalner, Raleigh, NC (US);
Satyaki Ganguly, Cary, NC (US);
Assignee:
CREE, INC., Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2020.01); H01L 21/66 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2642 (2013.01); G01R 31/2621 (2013.01); H01L 22/14 (2013.01); H01L 22/34 (2013.01); G01R 31/26 (2013.01); G01R 31/2601 (2013.01); G06F 11/3688 (2013.01); H01L 2224/13099 (2013.01); H01L 2924/00 (2013.01); H01L 2924/0002 (2013.01); H01L 2924/00014 (2013.01);
Abstract
A process and system for testing includes: arranging devices in a temperature-controlled environment; applying a negative gate bias voltage (Vgs) to the devices; applying a drain voltage (Vds) to the devices; measuring currents and/or voltages of the devices to generate device test data; determining a failure of one or more of the devices based on the device test data generated from the device currents and/or the voltages to generate failure data; and outputting the failure data for the of devices.