The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Apr. 20, 2018
Applicant:

Toyo Corporation, Tokyo, JP;

Inventors:

Tetsuya Nakamura, Tokyo, JP;

Naoki Tsuboi, Tokyo, JP;

Assignee:

TOYO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G01R 31/001 (2013.01); G01R 23/16 (2013.01);
Abstract

A radiated emission measurement method includes a prescan measurement step of performing broadband measurement including detection of a peak and detection of a quasi-peak by one fast Fourier transform in a target measurement frequency range; a calculation step of calculating a difference in level between the peak and the quasi-peak obtained for a measurement frequency to be a candidate for a result of measurement; a determination step of determining whether the obtained difference is less than a reference value; and an output step of outputting a result obtained as an interference level of the radiated emission in the broadband measurement when it is determined that the difference is less than reference value, and performing narrowband measurement and outputting the obtained result as the interference level of the radiated emission, when it is determined that the difference is equal to or higher than the reference value.


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