The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Dec. 13, 2019
Applicant:

Gerber Technology Llc, Tolland, CT (US);

Inventors:

Scott M Frankel, Berkeley, CA (US);

James F O'Brien, El Cerrito, CA (US);

Nathan Mitchell, Richmond, CA (US);

David T Jackson, Redwood City, CA (US);

Assignee:

GERBER TECHNOLOGY LLC, Tolland, CT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/36 (2006.01); G01N 3/06 (2006.01); G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 33/367 (2013.01); G01N 3/068 (2013.01); G01N 3/08 (2013.01);
Abstract

A material testing apparatus comprising a frame having three or more tracks, and a plurality of mounts positioned within the three or more tracks. The mounts including an attachment mechanism to attach the mounts to a material being tested. The mounts including a force measurement elements. Some of the mounts free mounts that move in a track slot within the track, the free mounts free to move to any position within the track slot. The apparatus further comprising a data collector to collect data from the force measurement elements in the mounts when the material is placed under stress, to characterize the material.


Find Patent Forward Citations

Loading…