The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 16, 2021

Filed:

Nov. 26, 2019
Applicant:

Oerlikon Metco (Us) Inc., Westbury, NY (US);

Inventors:

Kenneth Vecchio, San Diego, CA (US);

Justin Lee Cheney, Encinitas, CA (US);

Assignee:

Oerlikon Metco (US) Inc., Westbury, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/18 (2006.01); G06F 17/40 (2006.01); G01N 33/00 (2006.01); B01F 3/18 (2006.01); G16C 20/30 (2019.01); G01D 21/00 (2006.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G01N 25/18 (2013.01); B01F 3/188 (2013.01); G16C 20/30 (2019.02); G01D 21/00 (2013.01); G01N 2033/0003 (2013.01); G06F 17/40 (2013.01); G16C 20/70 (2019.02);
Abstract

The disclosed technology relates to a method of selecting a material composition and/or designing an alloy. In one aspect, a method of selecting a composition of a material having a target property comprises receiving an input comprising thermodynamic phase data for a plurality of materials. The method additionally includes extracting from the thermodynamic phase data a plurality of thermodynamic quantities corresponding to each of the materials by a computing device. The extracted thermodynamic quantities are predetermined to have correlations to microstructures associated with physical properties of the material. The method additionally includes storing the extracted thermodynamic quantities in a computer-readable medium. The method further includes electronically mining the stored thermodynamic quantities using the computing device to rank at least a subset of the materials based on a comparison of at least a subset of the thermodynamic quantities that are correlated to the target property.


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