The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Nov. 27, 2018
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Satoshi Sano, Kyoto, JP;
Kenji Kimura, Kyoto, JP;
Taro Shirai, Kyoto, JP;
Masanobu Sato, Kyoto, JP;
Takahiro Doki, Kyoto, JP;
Akira Horiba, Kyoto, JP;
Naoki Morimoto, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); A61B 6/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); A61B 6/484 (2013.01); G01B 11/25 (2013.01);
Abstract
This X-ray phase image capturing system () includes an X-ray source (), a plurality of gratings, and a detector (), a moving mechanism (), and an image processing unit (). The image processing unit () is configured to generate a phase-contrast image () based on a plurality of feature quantities () and feature quantitiesextracted from a plurality of X-ray image sets (R) acquired by performing fringe scanning a plurality of times in a short time.