The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11175240 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 16, 2021

Filed:

May. 10, 2018
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventor:

Shohei Otsuki, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95 (2013.01); G01N 21/8806 (2013.01); G01N 2021/888 (2013.01); G01N 2021/8887 (2013.01);
Abstract

An inspection apparatus includes: an upstream imaging mechanism that images an upstream wall surface extending from a bottom part of a recess upstream of and adjacent to a projection in a rotating direction of a workpiece to a tip of the projection; and a downstream imaging mechanism that images a downstream wall surface extending from a bottom part of the recess downstream of and adjacent to the projection in the rotating direction to the tip of the projection. At least one of the imaging mechanisms includes a mover for parallelly moving and positioning in an orthogonal plane orthogonal to the axis of symmetry and images the workpiece from a position radially outward of the workpiece and positioned by the mover.


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Otsuki, Shohei. (2021). Inspection apparatus and inspection method (U.S. Patent No. 11175240). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11175240

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