The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Feb. 20, 2019
Applicant:
Massachusetts Institute of Technology, Cambridge, MA (US);
Inventors:
Sanjay E. Sarma, Cambridge, MA (US);
Pranay Jain, Delhi, IN;
Assignee:
Massachusetts Institute of Technology, Cambridge, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 33/06 (2006.01); G01N 33/483 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4738 (2013.01); G01N 33/06 (2013.01); G01N 33/4833 (2013.01); G01N 33/49 (2013.01); G01N 2021/4769 (2013.01);
Abstract
A method for measuring one or more quantities characterizing a composition of a medium includes causing a first non-uniform spatially varying optical signal to impinge on a portion of the medium, processing a second optical signal emitted from the medium in response to the first optical signal including determining characteristics of a spatial variation of the second optical signal, and determining the one or more quantities characterizing the composition of the medium based on the characteristics of the spatial variation of the second optical signal.