The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 16, 2021
Filed:
Mar. 04, 2020
Korea Institute of Science and Technology, Seoul, KR;
Center for Advanced Meta-materials, Daejeon, KR;
Minah Seo, Seoul, KR;
Sang-Hun Lee, Seoul, KR;
Chulki Kim, Seoul, KR;
Jae Hun Kim, Seoul, KR;
Taikjin Lee, Seoul, KR;
Deok Ha Woo, Seoul, KR;
Korea Institute of Science and Technology, Seoul, KR;
Center for Advanced Meta-Materials, Daejeon, KR;
Abstract
One embodiment of the present invention provides an optical imaging apparatus using a metamaterial including a metamaterial array sensor which includes a plurality of unit cells made of a metamaterial and is positioned adjacent to an observation object, an imaging beam providing unit which provides an imaging beam toward the metamaterial array sensor, a control beam providing unit which controls a control beam provided to the unit cell to block the imaging beam incident on the unit cell, and an imaging beam measuring unit which measures a unit cell imaging beam transmission amount passing through the unit cell by measuring an imaging beam transmission amount of the metamaterial array sensor when the imaging beam passes through the unit cell and an imaging beam transmission amount of the metamaterial array sensor when the control beam is focused on the unit cell to block the imaging beam incident on the unit cell.